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 Intelligent Dielectric Loss Tester

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whgdmk1234 https://www.mktester.com/transformer-tester/capacitance-and-tan-delta-test-of-transformer/intelligent-dielectric-loss-tester.html
Overview:

The Intelligent dielectric loss tester also applies to the measurement of tgδ and electrical capacity of high voltage electrical equipments in the workshops, laboratories and research institutes.

It could measure non-grounded or grounded high voltage equipments adopting positive and negative connection method. Besides, it could measure the tgδ of capacitor voltage transformer and capacitance of main capacitor C1and C2.

Main Specifications:

Control panel: printer, keyboard, indicator and communication transferring.

Variable frequency power supply: SPWM switching circuit is adopted to generate and output high-power sine wave stable voltage.

Step-up transformer: the output of variable frequency power supply is stepped up to the measuring voltage. The maximum reactive power output is 2KVA/one minute.

Standard capacitor: internal Cn. It is the measuring basis.

Cn current detection: it is used to detect the internal standard capacitor current, 10μA ~ 1A. The input resistance is <2Ω.

Cx positive connection current detection: it is only used for the measurement of positive connection, 10μA ~ 1A. The input resistance is <2Ω.

Cx negative connection current detection: it is only used for the measurement of negative connection, 10μA ~ 1A. The input resistance is <2Ω.

Negative connection digital isolation communication: precision MPPM digital modem is adopted to transmit the current signal of negative connection to the low voltage side. The isolation voltage is 20KV.

Precautions:

1.The connection mode should be based on the installation of equipment. Corresponding connection mode should be selected in the menu option.

2. The testing voltage level should be selected according to different equipment and the desired voltage should be selected in the corresponding menu option.

3.Under the special circumstances of endangering safety during the testing, the main power supply could be switched off.

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